Title : BOOM: Enabling Mobile Memory Based Low-Power Server DIMMs
Speaker : Doe Hyun Yoon (Post doctoral researcher at Intelligent Infrastructure Lab., HP Labs.)
Date & Time : 2012. 5. 31. 목요일 16:00
Where : 융대원 D-111
Abstract
To address the real-time processing needs of large and growing amounts of data, modern software increasingly uses main memory as the primary data store for critical information. This trend creates a new emphasis on high capacity, high-bandwidth, and high-reliability main memory systems. Conventional and recently-proposed server memory techniques can satisfy these requirements, but at the cost of significantly increased memory power, a key constraint for future memory systems. In this talk, we exploit the low-power nature of another high volume memory component?mobile DRAM?while improving its bandwidth and reliability shortcomings with a new DIMM architecture. We propose Buffered Output On Module (BOOM) that buffers the data outputs from multiple ranks of low frequency mobile DRAM devices, which in aggregation provide high bandwidth and achieve chipkill-correct or even stronger reliability. Our evaluation shows that BOOM can reduce main memory power by more than 73% relative to the baseline chipkill system, while improving average performance by 5% and providing strong reliability. For memory-intensive applications, BOOM can improve performance by 30~40%.
Biography
Doe Hyun Yoon is a post-doctoral researcher at Hewlett-Packard Labs.
His research includes power efficiency and reliability in memory systems, including caches, DRAM, and nonvolatile memory. He has a PhD in electrical and computer engineering from the University of Texas at Austin.
초청자 : 지능형융합시스템학과 안정호 교수 (연락처 : 031-888-9144, gajh@snu.ac.kr)
